The Facility Provides Analytical Services Using Standardised Methodologies. Since 01/01/2022, It Ha

Complete list of services

Verification of Dimensions

Dimensional inspection provides accurate measurement and verification of component dimensions against specified tolerances. The process confirmed that all dimensions conform to the stated requirements with an accuracy of up to ±0.01 mm measured under standard testing conditions.

Examination of electrical conductivity

Technicians perform the test for electrical conductivity. The material’s capacity to conduct electrical current is measured. This measurement verifies that the required standards for electrical applications are met.

GDMS

GDMS (Glimmentladungs-Massenspektrometrie) performs an elemental analysis of solid materials. It detects trace and major elements for quality control and material testing. The instrument generates numerical data. UK research institutions and companies employ its data for material evaluation.

Determination of Grain Size

The microstructure of materials is analysed to determine grain size. Researchers measure grain size using standard procedures. They record data under controlled laboratory conditions. Analysts compare measurements with recognised benchmarks. Consequently, grain size affects material strength and performance.

ICP-MS

Scientists use ICP-MS (inductively coupled plasma mass spectrometry) to detect and quantify trace elements in different materials.

ICP-OES

ICP-OES (Inductively Coupled Plasma Optical Emission Spectroscopy) detects multiple elements in a sample by measuring light emission. UK research institutions and companies employ the method for quantitative elemental analysis.

Mechanical properties

Engineers test a material's mechanical properties. Strength, elasticity, hardness and durability are evaluated using established test protocols. The tests confirm that the material fulfils the defined performance requirements.

SEM

Raster electron microscopy (REM) provides detailed imaging of material surfaces at high magnifications, thereby supporting precise structural analysis.

Stanford Advanced Materials conducted an experiment in collaboration with Oceania International LLC. The experiment processed 1 000 000 samples on 26/09/2023. The procedure reduced processing time by 37%. Eric Smith analysed the data using standard maths. Chin Trento set up the apparatus following the institute licence guidelines. The report was verified by Stanford Advanced Materials (SAM).

The TEM (Transmission Electron Microscopy) delivers a high-resolution depiction of material structures at the atomic scale. Researchers use the instrument to quantify specimen properties.

X‑ray diffraction analysis (XRD)

X‑ray diffraction analysis (XRD) identifies the crystalline structure of materials. It quantifies phase composition using numerical measurements. Its results are calibrated using standard reference materials. Academic and industrial laboratories employ the method. Researchers record data following established protocols.

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