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CY3437 Gold-plated Silicon Wafer (Au/Cr Coated SiO2/Si Substrate)

Catalogue Number CY3437
Composition Au, Cr, SiO2, Si
Resistivity <0.005 ohm.cm
Dimensions 4" diameter +/- 0.5 mm x 0.5 mm
Polishing One side polished
Surface finish < 10 A RMS

Au/Cr-coated SiO2/Si-substrates can be utilised at the nanoscale in scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscopes. Stanford Advanced Materials (SAM) has extensive experience in manufacturing and supplying high-quality optical products.

Related products: Aluminium film on silicon wafer, Au/Ti coated SiO2/Si substrate, Pt coated SiO2/Si substrate, Ag-coated silicon wafers

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