CB10342 Highly Oriented Pyrolytic Graphite (HOPG) Substrate (SPI-2 Grade) 10x10x1.0 mm

Highly Oriented Pyrolytic Graphite (HOPG) Substrate (SPI-2 Grade) 10x10X1.0 mm Description

Highly Oriented Pyrolytic Graphite (HOPG) Substrate (SPI-2 Grade) 10x10 mm is a carbon substrate manufactured using advanced graphitization methods resulting in a high degree of layer alignment. The 10x10 mm size with a 1.0 mm thickness supports consistency in surface topography, making it suitable for calibration and analytical studies. Its flat and chemically inert surface minimises unwanted interactions with sensitive materials and equipment in research environments.

Highly Oriented Pyrolytic Graphite (HOPG) Substrate (SPI-2 Grade) 10x10X1.0 mm Applications

R&D and Semiconductor Testing
- Use as a calibration standard in surface science equipment to achieve accurate baseline measurements by leveraging its atomically flat and inert surface.
- Applied as a test substrate in thin film deposition studies to maintain consistent interface properties, facilitating comparative material analysis.

Analytical Instrumentation
- Frequently used as a support in scanning probe microscopy systems to enhance imaging clarity by utilising its uniform topography.
- Serves as a reference surface in spectroscopy measurements to achieve low background interference due to its stable carbon bonding structure.

Highly Oriented Pyrolytic Graphite (HOPG) Substrate (SPI-2 Grade) 10x10X1.0 mm Packing

The substrate is individually packaged in a static-free protective envelope and secured within foam-lined boxes to mitigate mechanical impacts and contamination. Storage under controlled humidity and temperature conditions is recommended to preserve the integrity of the carbon surface. Anti-static measures and clean handling procedures are implemented, and options for customised labelling and compartmentalisation are available upon request.

Frequently Asked Questions

Q1: What role does the crystallographic orientation play in this graphite substrate?
A1: The crystallographic alignment ensures an atomically flat surface that is critical for precise calibration applications. It minimises surface roughness, reducing measurement variances in sensitive characterisation techniques.

Q2: How is surface integrity maintained during production?
A2: Stanford Advanced Materials (SAM) employs surface characterisation methods such as Raman spectroscopy and electron microscopy to monitor and control defect densities. These tests verify the consistency of the substrate, ensuring it meets the strict requirements for research and analytical applications.

Q3: Are there specific handling precautions for this HOPG substrate?
A3: Yes, due to its delicate surface, the substrate should be handled with anti-static gloves and stored in a clean, low-humidity environment. This minimises potential contamination and mechanical stress that could affect its surface properties.

Additional Information

Graphite substrates like HOPG are integral in materials science research due to their distinct layered structure and chemical inertness. The graphitisation process enhances the alignment of graphene layers, making these substrates valuable for applications requiring flat, stable surfaces. Understanding the relationships between surface morphology and material behaviour is essential for advancing studies in nanotechnology and surface physics.

With an emphasis on controlled manufacturing and rigorous quality control, substrates within this category support various analytical techniques and calibration processes. The study of carbon-based materials continues to evolve, impacting fields from semiconductor research to advanced spectroscopy.