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CY11158 Titanium Nitride (TiN) Coated Glass

Catalogue Number CY11158
Material TiN, Borosilicate Glass
Purity TiN: ≥99.995%
Form Substrate

Titanium Nitride (TiN) Coated Glass is produced by depositing a TiN film on a high-purity glass substrate via controlled physical vapor deposition. Stanford Advanced Materials (SAM) utilises rigorous film thickness and uniformity measurements employing atomic force microscopy and optical inspection. This approach minimises surface irregularities and guarantees quantifiable film integrity for semiconductor raw material applications, adding technical consistency to the production process.

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FAQ

What are the critical parameters to control during the TiN deposition process on glass substrates?

Key parameters include the deposition rate, chamber pressure, and substrate temperature. Careful control of these factors ensures uniform film thickness and minimises defects that could affect the optical and conductive properties required in semiconductor applications.

How does the TiN coating influence the thermal stability of the glass substrate?

The TiN film enhances thermal resilience by serving as a barrier to heat and environmental contaminants. This reduces thermal expansion mismatch between layers, ensuring stability during high-temperature processing steps typical in semiconductor fabrication.

Which inspection techniques are recommended for verifying the integrity of the TiN coating?

Techniques such as atomic force microscopy, ellipsometry, and optical inspection are effective in assessing film uniformity and thickness. These measurements help confirm that the coating meets the precise technical criteria necessary for semiconductor raw material applications. Contact us for further details.

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