PE14016 PEEK IC Test Socket

Catalogue Number	PE14016
Material	PEEK
Form	Socket

PEEK IC Test Socket is a precision-engineered component manufactured from high-purity PEEK for integrated circuit testing applications. Stanford Advanced Materials (SAM) utilises advanced machining and dimensional verification procedures such as coordinate measuring machines (CMM) to ensure tight tolerances. Their quality control process includes detailed inspection and material certification, ensuring consistency in electrical insulation and mechanical performance.
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FAQ

What failure modes are commonly observed in PEEK IC Test Sockets under repeated thermal cycling?

Under thermal cycling, PEEK IC Test Sockets may demonstrate micro-cracking or slight dimensional changes due to differences in thermal expansion. Regular inspections and appropriate thermal management can reduce these occurrences. Contact us for more detailed guidance on thermal endurance testing.

How does the chemical inertness of PEEK benefit the functionality of an IC test socket?

PEEK’s chemical inertness prevents reaction with cleaning chemicals and minimises contamination during testing. This characteristic helps preserve the socket’s electrical insulation and mechanical integrity, promoting consistent performance in electronic testing setups.

Which machining considerations are critical to maintain dimensional accuracy in PEEK IC Test Sockets?

Maintaining tight machining tolerances requires optimised cutting parameters and cooling methods to avoid thermal distortion. Using precision CNC machining and frequent calibration of measuring instruments ensures consistent dimensional accuracy critical for reliable IC alignment.

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Parameter	Value
Material	PEEK
Form	IC Test Socket
Dimensions	Customised
Tensile Strength	95 MPa
Tensile Modulus	3.8 GPa
Elongation at Break	35
Flexural Strength	155 MPa
Flexural Modulus	3.5 GPa
Melting Point	343℃
Glass Transition Temperature	143℃
Heat Deflection Temperature	152℃
Coefficient of Thermal Expansion	45 ppm·K^-1
Thermal Conductivity	0.29 W/(m·K)
Dielectric Strength	20 kV/mm
Dielectric Constant	3.0
Surface Resistivity	10¹⁵
Melt Flow Index	6-10 g/10 min
Density	1.3 g/cm3

Parameter	Value
Material	PEEK
Form	IC Test Socket
Dimensions	Customised
Tensile Strength	95 MPa
Tensile Modulus	3.8 GPa
Elongation at Break	35
Flexural Strength	155 MPa
Flexural Modulus	3.5 GPa
Melting Point	343℃
Glass Transition Temperature	143℃
Heat Deflection Temperature	152℃
Coefficient of Thermal Expansion	45 ppm·K^-1
Thermal Conductivity	0.29 W/(m·K)
Dielectric Strength	20 kV/mm
Dielectric Constant	3.0
Surface Resistivity	10¹⁵
Melt Flow Index	6-10 g/10 min
Density	1.3 g/cm³

PE14016 PEEK IC Test Socket

PEEK IC Test Socket Description

PEEK IC Test Socket Characteristics

PEEK IC Test Socket Applications

PEEK IC Test Socket Packing

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FAQ

What failure modes are commonly observed in PEEK IC Test Sockets under repeated thermal cycling?

How does the chemical inertness of PEEK benefit the functionality of an IC test socket?

Which machining considerations are critical to maintain dimensional accuracy in PEEK IC Test Sockets?

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