{{flagHref}}
Products
  • Products
  • Categories
  • Blog
  • Podcast
  • Application
  • Document
|
/ {{languageFlag}}
Select language
Stanford Advanced Materials {{item.label}}
Stanford Advanced Materials
Select language
Stanford Advanced Materials {{item.label}}
a

Probing the upper band gap of atomic rhenium disulphide layers

Title Probing the upper band gap of atomic rhenium disulphide layers
Authors Krishna P. Dhakal, Hyunmin Kim, Seonwoo Lee, Youngjae Kim, JaeDong Lee, Jong-Hyun Ahn
Magazine Light, Science & Applications
Date 11/28/2018
DOI 10.1038/s41377-018-0100-3
Introduction This study focuses on the ultrafast carrier dynamics and electronic states of exfoliated ReS2 films using time-resolved second harmonic generation (TSHG) microscopy and density functional theory (DFT) calculations. We observed the second harmonic generation (SHG) of various thicknesses using a 1.19-eV beam. An increment was noted up to approximately 13 nm, followed by a reduction due to bulk interferometric light absorption. A pump pulse adjusted to the exciton band gap (1.57 eV) resulted in a decay-to-rise TSHG profile based on the probe delay. The electron–hole recombination is influenced by defects and surfaces, with two photon absorptions of 2.38 eV in the excited state being restricted due to the correlation with forbidden d–d intrasubshell orbital transitions. Using a frequency-doubled pump (2.38 eV) alongside wavelength-variant SHG probes (2.60–2.82 eV), we detected variations in TSHG profiles from decay-to-rise to rise-to-decay, suggesting an additional electron absorption state (s-orbital) approximately 5.05 eV from the highest occupied molecular orbital states. This finding was critically evaluated considering the electronic transitions and a small upper band gap (~0.5 eV) using modified DFT calculations.
Quote Krishna P. Dhakal, Hyunmin Kim and Seonwoo Lee et al. Probing the upper band gap of atomic rhenium disulphide layers. 2018. DOI: 10.1038/s41377-018-0100-3
Materials Chemical Compounds
Related papers
Loading... Please wait...
Publish your research and articles on the SAM website
Disclaimer
This site only provides metadata for academic works to enable users to easily find relevant information. For full access to the works, please use the DOI to visit the original publisher's website. The data comes from publicly accessible scientific databases and complies with the terms of use of these platforms. If you have any concerns regarding copyright, please contact us. We will address them immediately.

Success! You are now subscribed.

You have successfully subscribed! Check your inbox soon to receive great emails from this sender.
Leave A Message
Leave A Message
* Your Name:
* Your Email:
* Product Name:
* Your Phone:
* Comments: