Surface conduction and reduced electrical resistivity in ultrathin noncrystalline NbP semimetal

Title	Surface conduction and reduced electrical resistivity in ultrathin noncrystalline NbP semimetal
Authors	Asir Intisar Khan, Akash Ramdas, Emily Lindgren, Hyun-Mi Kim, Byoungjun Won, Xiangjin Wu, Krishna Saraswat, Ching-Tzu Chen, Yuri Suzuki, Felipe H. da Jornada, Il-Kwon Oh, Eric Pop
Magazine	Science
Date	01/03/2025
DOI	10.1126/science.adq7096
Introduction	The electrical resistivity of conventional metals such as copper typically increases in thin films due to electron-surface scattering, which limits their performance in nanoscale electronics. This study reveals an unexpected decrease in resistivity with reduced film thickness in niobium phosphide (NbP) semimetal films deposited at 400°C. Films thinner than 5 nanometres exhibit room temperature resistivity significantly lower than bulk NbP and conventional metals of similar thickness. These non-crystalline films feature local nanocrystalline order within an amorphous matrix. Our analysis indicates that surface channel conduction, high surface carrier density, and good mobility contribute to the lower resistivity as thickness decreases. These findings suggest potential for ultrathin, low-resistivity wires in nanoelectronics beyond conventional metal limitations.
Quote	Asir Intisar Khan, Akash Ramdas and Emily Lindgren et al. Surface conduction and reduced electrical resistivity in ultrathin noncrystalline NbP semimetal. Science. 2025. Vol. 387(6729):62-67. DOI: 10.1126/science.adq7096
Element	Niobium (Nb)
Materials	Semiconductors
Industry	Electronics