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CY11155 Iridium (Ir) Coated Silicon Wafer

Catalogue Number CY11155
Material Iridium, Silicon
Purity Ir: ≥99.9%
Form Substrate

Iridium (Ir) Coated Silicon Wafer is a silicon substrate featuring a thin iridium film applied through controlled deposition. Stanford Advanced Materials (SAM) employs sputter deposition and SEM surface mapping for quality screening, precisely monitoring film thickness and uniformity. This method minimises oxidation and contamination risks during high-temperature processes. SAM's technical framework ensures that each wafer meets strict fabrication specifications for semiconductor research and process development.

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FAQ

How does the iridium coating impact wafer performance under elevated temperatures?

The iridium layer acts as a barrier against oxidation and metal diffusion, protecting the silicon substrate during high-temperature processes. Its controlled deposition minimises contamination, thereby ensuring the wafer maintains its structural integrity during thermal cycles.

What deposition technique is utilised to achieve the uniform iridium layer?

The iridium coating is applied using a sputter deposition method. This technique enables precise control over film thickness and uniformity, which is critical for ensuring consistent material properties during semiconductor fabrication.

Are there integration challenges when incorporating iridium-coated wafers into standard semiconductor processes?

Integration requires careful control of deposition parameters and subsequent cleaning steps. However, the coating is engineered to be compatible with conventional CMOS fabrication processes, though periodic verification of film uniformity through SEM is recommended.

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