CY9435 Silver Single Crystal Substrate Ag Crystal Substrate (100), 10x10x0.5 mm, SSP

Silver Single Crystal Substrate Ag Crystal Substrate (100), 10x10x0.5 mm, SSP Description

This substrate is a silver single crystal with a defined (100) orientation, measuring 10 mm by 10 mm with a thickness of 0.5 mm. It is engineered for applications in material characterisation and semiconductor fabrication, where a well-defined crystal lattice is essential. The substrate’s evaluation through X-ray diffraction and atomic force microscopy ensures minimal defect density and a uniform surface, making it suitable for calibration and advanced materials research.

Silver Single Crystal Substrate Ag Crystal Substrate (100), 10x10x0.5 mm, SSP Applications

Electronics
- Use as a platform in microelectronic devices to achieve uniform thin film deposition by utilising its controlled crystallographic orientation for improved epitaxial growth.
- Applied as a base in sensor components to obtain stable conductive properties by leveraging its single crystal structure.

Industrial
- Used as an element in thermal management systems within circuit assemblies to facilitate effective heat dissipation by utilising silver’s inherent thermal conductivity.
- Employed in precision metrology devices to ensure accurate calibration by capitalising on the substrate’s consistent dimensional properties.

Silver Single Crystal Substrate Ag Crystal Substrate (100), 10x10x0.5 mm, SSP Packing

The substrate is packaged in an anti-static carrier with foam cushioning and sealed within a moisture-barrier container to safeguard against mechanical stress and contamination. It is stored under temperature-controlled and low-humidity conditions to preserve its microstructural integrity. Additional customisation, such as compartmentalised packaging and specific labelling, is available upon request, ensuring proper handling during transportation and storage.

Frequently Asked Questions

Q1: How is the crystallographic orientation verified?
A1: The substrate undergoes X-ray diffraction analysis, which verifies its (100) orientation with quantitative measurements of lattice parameters. This method confirms that the crystal structure meets required specifications for integration into research and fabrication processes.

Q2: What storage conditions are recommended for this substrate?
A2: Storage in a controlled environment with low humidity and stable temperature is recommended. These conditions minimise contamination and prevent moisture-induced surface changes, thus maintaining the substrate's defined crystallographic structure.

Q3: Can this substrate be integrated with standard semiconductor processing equipment?
A3: Yes, its dimensions of 10x10 mm and 0.5 mm thickness suit common wafer-handling systems. The substrate’s uniform surface and controlled crystal orientation facilitate compatibility with existing deposition and etching processes used in semiconductor fabrication.

Additional Information

Silver single crystal substrates play a critical role in materials science research by providing an ideal platform for studying crystallographic behaviour and surface phenomena. Their well-defined orientations are essential for applications where anisotropic electrical and thermal properties are critical. Detailed structural assessments using diffraction techniques enhance understanding of crystal dynamics in conductive metals.

In the broader context of materials engineering, substrates such as these enable precise calibration of experimental setups and contribute to advancements in microfabrication technologies. Their integration with advanced measurement tools, like atomic force microscopy and electron microscopy, supports the development and optimisation of next-level electronic devices and sensor systems.