CY9438 Silver Single Crystal Substrate Ag Crystal Substrate (111), 5x5x0.5 mm, SSP

Silver Single Crystal Substrate Ag Crystal Substrate (111), 5x5x0.5 mm, SSP Description

The silver single crystal substrate features a (111) crystallographic orientation and precise dimensions of 5 mm by 5 mm by 0.5 mm. Its single crystalline structure ensures a uniform surface that supports accurate interface studies and thin film depositions. Verification through X-ray diffraction and electron microscopy confirms its structural integrity, making it suitable for microelectronic and material science experiments.

Silver Single Crystal Substrate Ag Crystal Substrate (111), 5x5x0.5 mm, SSP Applications

Electronics
• Used as a conductive layer in semiconductor interconnect tests to achieve low-resistance pathways by utilising its uniform electrical properties.

Industrial Research
• Applied as a substrate in thin film deposition studies to enhance film uniformity and support systematic surface analysis by leveraging its defined crystallographic orientation.

Analytical Instruments
• Used as a calibration standard in diffraction equipment to confirm angular resolution accuracy by employing its precise (111) plane alignment.

Silver Single Crystal Substrate Ag Crystal Substrate (111), 5x5x0.5 mm, SSP Packing

The substrate is individually packaged in an anti-static container with foam cushioning to reduce mechanical stress and contamination. It is sealed in inert packaging materials and stored under controlled temperature and humidity to prevent oxidation. Custom packaging options, such as labelled compartments and additional protective layers, are available to accommodate specific laboratory handling and storage requirements.

Frequently Asked Questions

Q1: How is the (111) orientation of the substrate verified?
A1: The (111) orientation is confirmed through calibrated X-ray diffraction analysis and corroborated by electron microscopy, ensuring the crystal plane alignment meets experimental specifications.

Q2: What contamination control measures are implemented during fabrication?
A2: The fabrication process occurs in a cleanroom environment employing filtered air and inert atmospheres. Post-fabrication, the surface undergoes electron microscopy inspection to detect and minimise particulate contamination.

Q3: Is it possible to modify the substrate dimensions for specific research needs?
A3: Customising dimensions requires process recalibration. Coordination with SAM’s technical staff is necessary to assess feasibility, as alterations may affect crystal growth conditions and subsequent quality control parameters.

Additional Information

Single crystal silver substrates play a significant role in advanced material studies, particularly in assessing surface phenomena, electron transport, and thin film deposition. Their well-defined crystallographic orientations are essential for controlled experimental setups in various applied research scenarios.

Understanding the inherent properties of silver and the impact of crystal structure is crucial in materials science. Characterisation techniques, including X-ray diffraction, scanning electron microscopy, and atomic force microscopy, are routinely employed to ensure the substrate meets specific research requirements in electronics and related fields.