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CY9448 Copper Single Crystal Substrates Cu Substrate (100), Dia. 50 mm x 1 mm, SSP

Catalogue Number CY9448
Material Cu
Purity ≥99.99%
Shape Disc
Form Substrate

Copper Single Crystal Substrates Cu Substrate (100), Dia. 2 inch x 1 mm, SSP is produced with a controlled (100) crystallographic orientation using refined crystal growth methods. Stanford Advanced Materials (SAM) applies rigorous process monitoring, including SEM surface inspections and X-ray diffraction analysis, to identify microstructural uniformity and low defect density. SAM integrates quantitative quality control measures to ensure consistency in substrate flatness and purity, essential for advanced semiconductor and materials research applications.

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