CY9453 Copper Single Crystal Substrates Cu Substrate (110), 20x20x1 mm, SSP

Copper Single Crystal Substrates Cu Substrate (110), 20x20x1 mm, SSP Description

Copper Single Crystal Substrates Cu Substrate (110), 20x20x1 mm, SSP are produced with high-purity copper in a controlled single crystal growth process. The specified (110) orientation is verified with X-ray diffraction to ensure uniform crystallographic alignment. The 20x20 mm dimension facilitates compatibility with standard laboratory sample holders, while the 1 mm thickness offers sufficient rigidity during surface analysis and deposition experiments. This technical substrate supports detailed microstructural and surface energy studies in academic and industrial settings.

Copper Single Crystal Substrates Cu Substrate (110), 20x20x1 mm, SSP Applications

Electronics and Semiconductor Research
- Use as a deposition substrate in thin film fabrication systems to achieve controlled epitaxial layer alignment by utilising its defined (110) crystal orientation.

Materials Science Analysis
- Use as a calibration sample in X-ray diffraction and electron microscopy to obtain accurate lattice measurements by utilising its uniform single crystal structure.

Industrial Process Development
- Use as a reference material in quality assessment of copper components to achieve consistent microstructural evaluations by utilising its precise crystallographic properties.

Copper Single Crystal Substrates Cu Substrate (110), 20x20x1 mm, SSP Packing

Copper Single Crystal Substrates are enclosed in anti-static pouches and positioned within foam-lined containers to mitigate mechanical impact. The packaging integrates moisture barriers to prevent oxidation and contamination during transit and storage. It is recommended to store the substrates in a controlled, dry environment at room temperature. Additional packaging customisation, including specialised cushioning and labelling, is available upon request.

Frequently Asked Questions

Q1: How is the (110) orientation verified during production?
A1: The (110) orientation is determined using X-ray diffraction analysis, which provides precise angular measurements. Scanning electron microscopy further confirms the uniformity of the crystal lattice, ensuring the substrate meets the required specifications for technical applications.

Q2: What are the tolerances for the substrate dimensions and thickness?
A2: The substrate dimensions of 20x20 mm and a thickness of 1 mm are maintained within strict tolerances using calibrated cutting and polishing equipment. These controlled dimensions support reproducible experimental setups and ensure consistency in material testing.

Q3: Can these substrates undergo cleaning and surface preparation without affecting crystal quality?
A3: Yes, standardised cleaning protocols such as solvent rinsing and low-energy plasma treatments are employed to remove contaminants while preserving the (110) crystal integrity. These procedures are optimised to avoid inducing microstructural changes that could impact performance.

Additional Information

Copper single crystal substrates are pivotal in research areas that investigate fundamental surface interactions and thin film growth. Their well-defined crystallographic structure enables detailed analysis of grain boundaries and defect densities, contributing to improved process control in material science laboratories.

In industrial environments, such substrates are often used as calibration standards and reference materials. Their consistent properties allow for comparative studies and development of new processing techniques, thereby facilitating advanced research and quality assurance in copper-based applications.