CY9471 Nickel Single Crystal Substrate Ni Substrate (110), 10x10x1 mm, SSP

Nickel Single Crystal Substrate Ni Substrate (110), 10x10x1 mm, SSP Description

Nickel Single Crystal Substrate Ni Substrate (110), 10x10 mm, SSP is a high-purity single crystal nickel substrate produced with an (110) crystallographic orientation. The 10x10 mm surface area and 1 mm thickness facilitate integration into experimental setups requiring controlled grain structure and minimal surface defects. The substrate undergoes rigorous SEM and diffraction analysis ensuring structural accuracy, which supports advanced research in materials science and semiconductor processing environments.

Nickel Single Crystal Substrate Ni Substrate (110), 10x10x1 mm, SSP Applications

Electronics and Semiconductor Applications
- Used as a substrate in semiconductor wafer processing to achieve defined epitaxial layers by harnessing its controlled (110) orientation.
- Applied in thin-film deposition studies to evaluate layer uniformity and minimise lattice mismatch.

Industrial Material Testing
- Serves as a calibration standard for surface roughness measurement systems to support accurate analysis of metallic films.
- Frequently used in research setups to validate metallurgical properties through consistent crystallographic structure.

Nickel Single Crystal Substrate Ni Substrate (110), 10x10x1 mm, SSP Packing

The substrate is individually packaged in anti-static, cushioned containers to mitigate mechanical shock and contamination. It is stored in a temperature-controlled, dry environment to preserve its surface characteristics. Protective materials and sealed storage options are employed to prevent particulate exposure. Custom labelling and packaging configurations are available to accommodate specific handling and traceability requirements.

Frequently Asked Questions

Q1: What methods are used to verify the (110) orientation on the substrate?
A1: Surface X-ray diffraction and scanning electron microscopy are employed to confirm the (110) crystallographic orientation and assess any deviations in lattice structure. These techniques provide quantitative data on the substrate’s structural uniformity for applied research.

Q2: How should the substrate be handled to prevent contamination?
A2: Handle the substrate in a clean environment using anti-static gloves and tools. Minimise exposure to airborne particulates by employing dedicated storage containers and clean-room protocols to maintain its surface integrity.

Q3: Is it possible to adjust the substrate dimensions for specific applications?
A3: The current model is standardised at 10x10x1 mm. For custom dimensions, consultation with Stanford Advanced Materials (SAM) technical specialists is required to evaluate process modifications and feasibility based on research or production needs.

Additional Information

Nickel single crystals offer a defined crystallographic orientation that is critical for experimental studies in metallurgy and semiconductor processing. Their consistent grain structure and surface properties facilitate controlled studies on epitaxial film formation and metallic behaviour under various processing conditions.

Research in single crystal substrates contributes to understanding phase transitions and surface phenomena in metals. This foundational knowledge supports improvements in deposition techniques and guides the development of advanced materials for industrial and academic applications.