CY9472 Nickel Single Crystal Substrate Ni Substrate (110), 20x20x1 mm, SSP

Nickel Single Crystal Substrate Ni Substrate (110), 20x20x1 mm, SSP Description

Nickel Single Crystal Substrate Ni Substrate (110), 20x20x1 mm, SSP is a single crystal nickel substrate with a (110) orientation. Its dimensions align with standard processing equipment for semiconductor and materials science applications. The uniform crystal structure reduces grain boundary effects, which is critical for experiments that demand atomic-level consistency. Quality verification via X-ray diffraction and electron microscopy confirms its microstructural integrity for precise material analysis.

Nickel Single Crystal Substrate Ni Substrate (110), 20x20x1 mm, SSP Applications

Electronics and Semiconductor Processing
- Used as a substrate in epitaxial growth to achieve minimal lattice mismatch by leveraging its uniform (110) orientation.
- Applied in semiconductor wafer calibration to optimise layer deposition with reduced structural variability.

Materials Science Research
- Employed as a test specimen in surface analysis to detect crystallographic defects by leveraging its single crystal uniformity.
- Utilised in thin-film deposition studies to ensure reproducible interface quality through controlled orientation.

Industrial Metrology
- Serves as a calibration standard in precision microscopy to ensure dimensional accuracy by leveraging its defined geometry.
- Applied in quality assurance setups to support consistent measurement results through its homogenous crystal structure.

Nickel Single Crystal Substrate Ni Substrate (110), 20x20x1 mm, SSP Packing

The substrate is packed in an anti-static container with foam inserts to mitigate mechanical shocks during transit. It is wrapped in moisture-resistant material and stored under controlled ambient conditions to prevent surface oxidation and contamination. Custom labelling and compartmentalised packaging options are available to meet specific handling and storage protocols.

Frequently Asked Questions

Q1: What measures are implemented to verify the substrate's crystallographic orientation?
A1: X-ray diffraction analysis is used to confirm the (110) orientation, while electron microscopy examines the surface structure. These methods ensure the material meets stringent crystallographic requirements for high-precision research applications.

Q2: How does the single crystal structure influence substrate performance in research applications?
A2: The single crystal structure minimises grain boundary effects, facilitating accurate material characterisation. This uniformity supports reproducible experimental results and aids in correlating substrate behaviour with process outcomes.

Q3: What storage conditions are necessary to maintain the substrate's integrity?
A3: The substrate should be stored at room temperature in a low-humidity environment. Anti-static and moisture-resistant packaging is recommended to prevent surface oxidation and contamination during storage and transport.

Additional Information

Nickel substrates play a critical role in advanced materials research due to their uniform crystallinity and chemical stability. Their well-defined microstructure supports sophisticated material synthesis techniques, including epitaxial growth and thin-film deposition. Detailed morphological analysis, often conducted using SEM and XRD, provides essential insights into the substrate quality for experimental reproducibility.

In the broader context of non-ferrous metals, nickel substrates offer a consistent platform for exploring interfacial phenomena and electronic properties. Understanding these characteristics is vital for developing applications in semiconductor processing, sensor technology, and precision metrology.