CY9475 Nickel Single Crystal Substrate Ni Substrate (111), 5x5x1 mm, SSP

Nickel Single Crystal Substrate Ni Substrate (111), 5x5x1 mm, SSP Description

This substrate is manufactured from elemental nickel with a (111) crystallographic orientation and measures 5x5x1 mm. It is engineered to exhibit a controlled microstructure and low defect density, facilitating its use in semiconductor processing and materials analysis. SAM employs quantitative X-ray diffraction and SEM inspections to confirm the orientation and surface uniformity. Its chemically inert attributes and standardised dimensions aid in achieving reproducible outcomes during device integration and research applications.

Nickel Single Crystal Substrate Ni Substrate (111), 5x5x1 mm, SSP Applications

1.       Electronics
   - Used as a substrate in semiconductor devices to achieve consistent carrier mobility by leveraging its controlled (111) orientation.
   - Applied as a base for thin-film deposition in circuitry to lower defect incorporation by utilising its smooth surface finish.

2.       Research
   - Serves as a specimen for crystallographic studies in material science to obtain accurate structural data by utilising its uniform orientation properties.

3.       Industrial
   - Used as a target for thin-film sensor fabrication to enhance film adhesion by utilising the substrate’s homogeneous microstructure.

Nickel Single Crystal Substrate Ni Substrate (111), 5x5x1 mm, SSP Packing

The substrate is individually secured in anti-static pouches and arranged in foam-lined boxes to prevent mechanical damage and contamination. It is stored under controlled temperature and humidity conditions to maintain its structural integrity. Protective measures, including the use of inert gas-sealed bags and clean-room packaging, are implemented. Custom packaging options, such as compartmentalised inserts and specific labeling, are available upon request.

Frequently Asked Questions

Q1: What methods are used to verify the (111) orientation of the substrate?
A1: X-ray diffraction (XRD) and scanning electron microscopy (SEM) are employed to assess the (111) crystallographic orientation and confirm the overall crystallinity of the substrate during quality control inspections.

Q2: How do the defined dimensions of 5x5x1 mm affect its integration with other processes?
A2: The standardised dimensions ensure compatibility with conventional semiconductor processing equipment, facilitating uniform thin-film deposition and integration into established fabrication workflows.

Q3: What storage practices are recommended to maintain the substrate’s structural properties?
A3: The substrate should be stored in a temperature-controlled and moisture-free environment using anti-static packaging. This minimises contamination and mechanical stress, preserving the crystallographic integrity over time.

Additional Information

Nickel single crystal substrates are pivotal in materials science for applications requiring a consistent crystallographic orientation. These substrates assist in understanding atomic-scale interactions on surfaces and serve as fundamental platforms for thin-film deposition and device fabrication. The controlled microstructure contributes to reproducible experimental outcomes in advanced semiconductor research.

Nickel, as a non-ferrous metal, offers advantageous inert properties and stability at elevated temperatures. Its single crystal form minimises grain boundary defects, which is critical for applications demanding high structural uniformity. This contributes to improved performance in microelectronic devices and analytical research, where surface uniformity and controlled properties are essential.