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CY9496 Ultra-Flat Silicon Wafer P-Type, Dia. 6 inch x 675 μm thick

Catalogue Number CY9496
Material Si
Shape Disc
Form Substrate

Ultra-Flat Silicon Wafer P-Type, Dia. 6 inch x 675 μm thick is fabricated with tight control over doping and planarisation. Stanford Advanced Materials (SAM) employs advanced techniques, including chemical-mechanical polishing and interferometric surface measurement, to achieve a uniform and smooth wafer. The production process incorporates in-line metrology to monitor thickness uniformity and surface flatness. This rigorous quality control is critical for semiconductor process compatibility and advanced material research.

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