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SC9917 Recrystallized Silicon Carbide Beam 80 x 80 mm

Catalogue Number SC9917
Material SiC
Form Beam
Purity ≥99%
Density ~2.7 g/cm³

Recrystallized Silicon Carbide Beam 80 x 80 mm is a high-temperature ceramic component produced with precise control of microstructure and dimensional accuracy. Stanford Advanced Materials (SAM) utilises X-ray diffraction and scanning electron microscopy during fabrication to monitor grain alignment and density. This approach minimises microstructural deviations and ensures consistency, facilitating integration in applications where controlled thermal and mechanical properties are critical.

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