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ST11184 Copper Indium Gallium Planar Sputtering Target, CIG Target

Catalogue Number ST11184
Composition Cu, In, Ga
Purity ≥99.995%, or customized
Form Target
Shape Rectangular
Dimensions Customized

Copper Indium Gallium Planar Sputtering Target, CIG Target is a sputtering material prepared with a controlled composition for thin film deposition applications. Stanford Advanced Materials (SAM) employs advanced vacuum deposition and surface inspection techniques, such as SEM analysis, to monitor microstructural uniformity and composition precision. The process includes systematic batch testing to ensure that each target meets strict dimensional and compositional criteria.

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FAQ

How does the customised dimension of the sputtering target influence film uniformity?

Customized dimensions allow precise matching with deposition system geometries. This ensures that the plasma distribution across the target is optimised, which yields a more uniform thin film across the substrate. Adjustments in target size can help control deposition rates and film thickness consistency. Contact us for further details.

What role does the alloy composition play in the sputtering process performance?

The specific alloy composition of copper, indium, and gallium affects both the sputter yield and the film’s microstructure. Maintaining a strict compositional balance is crucial for achieving desired electrical and optical characteristics in the deposited films. Process adjustments can be made based on application requirements.

What quality control measures are implemented during production to minimise particulate contamination?

Quality control includes surface cleanliness verification using optical microscopy and particle count inspections. These measures ensure that contaminants remain below critical thresholds, thereby maintaining target surface integrity and consistency during sputtering. Contact us for detailed process information.

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