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ST11217 Titanium Silicide Planar Target, TiSi2 Target

Catalogue Number ST11217
Composition TiSi2
Purity ≥99.9%, or customized
Form Target
Shape Rectangular
Dimensions Customized

Titanium Silicide Planar Target, TiSi2 Target is a sputtering target engineered for thin film deposition applications. Stanford Advanced Materials (SAM) employs rigorous process controls including scanning electron microscopy and X-ray diffraction analysis to oversee microstructural consistency. The target is produced with a controlled composition to minimise defects and particulate release, ensuring uniform material erosion across the surface during sputtering.

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FAQ

What factors influence the uniformity of films when using a Titanium Silicide planar target for sputtering?

The planar configuration and controlled microstructure contribute to uniform erosion across the target surface. This minimises particulate generation and ensures consistent thin film deposition, provided that sputtering conditions are well-regulated.

How does the customisation of target dimensions benefit sputtering applications?

Custom dimensions enable integration with various sputtering systems, facilitating optimal power density and cooling configurations. This customisation aids in achieving uniform film deposition and adjusting process parameters to specific system requirements.

What analytical techniques are used during quality control of these targets?

Quality control involves surface morphology evaluation using scanning electron microscopy and atomic force microscopy. These techniques verify the microstructural integrity and ensure minimal defects, which are critical for maintaining deposition consistency.

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