CY9439 Aluminium Single Crystal Substrate (100), 10x10x0.5 mm, SSP

Aluminium Single Crystal Substrate (100), 10x10x0.5 mm, SSP Description

This substrate is formed from single crystal aluminium with a (100) orientation, measuring 10x10 mm with a thickness of 0.5 mm and designated as SSP. The controlled crystal growth process provides a uniform lattice structure critical for consistent electrical and mechanical performance. The precise dimensions and low defect density facilitate integration into sensitive applications, ensuring stable interfacial properties for semiconductor or materials analysis equipment.

Aluminium Single Crystal Substrate (100), 10x10x0.5 mm, SSP Applications

Electronics and Semiconductor Manufacturing
- Used as a platform in epitaxial layer deposition to achieve uniform film growth by leveraging its single crystal uniformity.
- Applied as a calibration standard in lithography systems to enhance dimensional control through its precise geometry.

Materials Research and Testing
- Serves as a substrate in surface analysis instruments to detect interfacial phenomena by using its low defect density.
- Used for stress analysis in crystalline studies to obtain accurate mechanical test results due to its defined crystallographic structure.

Aluminium Single Crystal Substrate (100), 10x10x0.5 mm, SSP Packing

The substrates are packaged in custom-engineered anti-static foam carriers within rigid, moisture-barrier containers. Each unit is sealed to prevent particulate deposition during transit. Storage guidelines recommend a dry, temperature-controlled environment to maintain crystalline integrity. Custom labeling and compartmentalisation options are available to tailor packaging for specific laboratory or industrial protocols.

Frequently Asked Questions

Q1: How does the (100) orientation impact the substrate’s performance?
A1: The (100) orientation provides a uniform atomic arrangement, enhancing electrical and mechanical consistency. This property is beneficial in applications requiring precise crystal alignment during epitaxial growth processes.

Q2: What specific quality control tests are performed on these substrates?
A2: Quality control includes microscopic examination and surface profilometry to verify low defect density and uniform thickness. These tests ensure that the substrates meet strict dimensional and crystallographic criteria.

Q3: Can these substrates be integrated with standard semiconductor processing equipment?
A3: Yes, the standard 10x10 mm size and 0.5 mm thickness are compatible with conventional semiconductor fabrication tools, ensuring ease of integration into existing processing lines.

Additional Information

Single crystal substrates are critical in advanced material research due to their predictable anisotropy and uniform properties, which allow for reliable experimental reproducibility. Researchers frequently employ such substrates to study interfacial phenomena and to calibrate high-precision measurement tools.

The study of aluminium as a single crystal material provides insights into its mechanical and electrical behaviours under controlled conditions. This understanding supports advancements in semiconductor technology and surface science, emphasising the relevance of controlled crystalline substrates in both academic and industrial research settings.