CY9443 Aluminium Single Crystal Substrate (111), 10x10x1 mm, SSP

Aluminium Single Crystal Substrate (111), 10x10x1 mm, SSP Description

The substrate is made from single-crystal aluminium with a (111) orientation, measuring 10x10x1 mm. Its uniform structural consistency minimises defects, enabling high-precision alignment in experimental setups. The controlled crystal orientation supports enhanced analysis in semiconductor fabrication and materials research, offering an ideal platform for studies requiring reliable spatial consistency and minimal grain boundary influence.

Aluminium Single Crystal Substrate (111), 10x10x1 mm, SSP Applications

1.       Electronics and Semiconductor Testing
   - Used as a reference substrate in semiconductor processing to achieve uniform layer deposition by leveraging its defect-minimised crystal structure.
   - Applied as a calibration standard in electron microscopy, providing a consistent background for improved imaging accuracy.

2.       Materials Research and Characterisation
   - Serves as a specimen in X-ray and electron diffraction studies to extract detailed crystallographic data due to its precise orientation.
   - Frequently used in investigations of crystal growth dynamics to evaluate phase stability with minimal structural variances.

Aluminium Single Crystal Substrate (111), 10x10x1 mm, SSP Packing

The substrate is secured in an antistatic, foam-lined container with moisture-resistant seals to reduce contamination risks. It is designed for storage in clean-room environments, ensuring minimal particulate intrusion. Additional custom packaging options, including protective wraps and individualised labelling, are available to meet specialised handling and transport requirements.

Frequently Asked Questions

Q1: How does the single crystal structure affect substrate performance in precision applications?
A1: The single crystal structure eliminates grain boundaries, reducing defect sites that can alter device behaviour. This uniformity supports high-precision process applications, ensuring consistency in research and semiconductor manufacturing.

Q2: What type of quality control tests are performed on this substrate?
A2: Quality control includes X-ray diffraction for verifying crystallographic orientation and optical microscopy to assess surface uniformity. These analyses confirm the substrate meets strict technical criteria required for high-resolution applications.

Q3: Are there options to modify the substrate dimensions for specific experiments?
A3: Yes, customisation in terms of size and thickness can be arranged. Adjustments are made following thorough process validation to align with experimental requirements and ensure maintained crystal quality.

Additional Information

Aluminium substrates with a single crystal structure are increasingly critical in advanced material studies. Their uniformity and minimised defect density allow researchers to precisely analyse electronic and crystallographic properties. Through rigorous quality control and specific fabrication techniques, these substrates enable a deeper understanding of aluminium's intrinsic properties. This knowledge aids in the development of experimental methodologies that contribute to advancements in semiconductor and material science research.