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  • CY3454 Ni Coated SiO2/Si Substrate

    • CY3454 Ni Coated SiO2/Si Substrate

    Catalogue Number CY3454
    Composition Ni, SiO2, Si
    Purity ＞99.99%
    Dimensions 4”, 10x10x0.5 mm, or customized
    Surface finish One side polished
    Orientation <100> ±0.5°

    Ni-coated SiO2/Si substrates can be utilised in the nanometre range, in scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscopes. Stanford Advanced Materials (SAM) possesses extensive experience in the manufacture and supply of high-quality optical products.

    Related products: Ti-coated SiO2/Si substrate, Cu-coated SiO2/Si substrate, Gold-coated silicon wafers, Pt-coated silicon wafers, Ag-coated silicon wafers

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    LAST RECOMMENDATION

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