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  • CY3452 Ti coated SiO2/Si Substrate

    • CY3452 Ti coated SiO2/Si Substrate

    Catalogue Number CY3452
    Composition Ti, SiO2, Si
    Dimensions 2, 4, 6, 8”
    Thickness Ti: 15-100nm, or customized

    Ti coated SiO2/Si substrates can be utilised in the nanodomain, in scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscopy techniques. Stanford Advanced Materials (SAM) has extensive experience in the manufacture and supply of high-quality optical products.

    Related products: Cu-coated SiO2/Si substrate, Ni-coated SiO2/Si substrate, gold-plated silicon wafers, Pt-coated silicon wafers, Ag-coated silicon wafers

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    LAST RECOMMENDATION

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