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ZN2277 Substrate for Zinc Oxide Wafer

Catalogue Number ZN2277
Material ZnO
Crystal Structure Hexagonal
Refractive Index 2.0681/2.0510

SAM offers zinc oxide wafer substrates with dimensions 10 x 10 x 0.5 mm. Wafers are inspected to confirm that they contain no detectable defects. A uniform thermal oxide layer is grown on these substrates to meet specific technical requirements.

Related products: Indium Antimonide Wafer, Silicon Carbide Wafer, Gallium Phosphide Wafer, Silicon Wafer, 1851 Germanium Wafer (Ge Wafer).

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